Document
Metadata
Author(s)
Lee, J.-C. | Lee, M. | Lee, H.-J. | Ahn, K. | Nam, J. | Park, S.
DOI
10.1002/adma.202004864
Title
Numerical Simulations and In Situ Optical Microscopy Connecting Flow Pattern, Crystallization, and Thin-Film Properties for Organic Transistors with Superior Device-to-Device Uniformity
Item Type
journalArticle
"Key
PGPRCST5
Publication Year
2020
Publication Title
Advanced Materials
ISSN
09359648 (ISSN)
Date
2020
Issue
48
Volume
32
Language
English