Cosmic ray ruggedness of power semiconductor devices for hybrid vehicles

Document

Metadata

Author(s)

Nishida, S. | Shoji, T. | Ohnishi, T. | Fujikawa, T. | Nose, N. | Ishiko, M. | Hamada, K.

DOI

10.1541/ieejeiss.130.934

Title

Cosmic ray ruggedness of power semiconductor devices for hybrid vehicles

Item Type

journalArticle

"Key

ZU7GXRE8

Publication Year

2010

Publication Title

IEEJ Transactions on Electronics, Information and Systems

ISSN

03854221 (ISSN)

Url

https://www.scopus.com/inward/record.uri?eid=2-s2.0-77954443792&doi=10.1541%2fieejeiss.130.934&partnerID=40&md5=5943751ee24c220a8722a6aa0ba873d0

Date

2010

Pages

934-938+4

Issue

6

Volume

130

Language

English

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